X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help


Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 295.0
Details PEG 4000, Lithium Sulfate, Tris, Copper (II) Chloride, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 186.84 α = 90
b = 67.61 β = 90
c = 56.08 γ = 90
Space Group P 21 21 2


Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate 58 cm long, Pt-coated fused silica, vertical focus mirror 2000-11-25
Diffraction Radiation
Monochromator Protocol
Cylindrically bent triangular Si(111) asymmetric cut horizontal focus SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline

Data Collection

Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 29.7 99.8 0.058 -- -- 3.6 203865 56854 -- -- 27.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.94 100.0 0.314 -- 2.3 3.6 4181


Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 30.0 -- -- -- 56783 -- -- -- -- 0.229 -- --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 1.94 5602 -- -- 0.35 -- -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
t_dihedral_angle_d 20.113
t_bond_d 0.02
t_angle_deg 3.111
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5220
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 174


Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
EPMR Structure Solution
TNT Structure Refinement
Software Name Purpose
TNT refinement
EPMR model building
SCALA data reduction
MOSFLM data collection