X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 298.0
Details lithium chloride, magnesium chloride, HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.38 α = 90
b = 67.84 β = 90
c = 115 γ = 90
Symmetry
Space Group I 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1999-12-13
Diffraction Radiation
Monochromator Protocol
58 cm long, Pt-coated, fused silica, vertical focus mirror; Cyclindrically bent triangular Si(111) asymmetric cut, horizontal focus monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.08 SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 23.3 99.1 0.072 0.072 -- 8.1 5246 5199 0.0 0.0 121.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.75 2.82 99.0 0.271 0.271 2.7 4.8 377

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.75 23.33 0.0 0.0 4812 4812 261 91.0 0.2311 0.2311 0.2277 0.2867 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.75 2.92 -- 36 654 0.4 0.527 0.088 80.4
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ANISOTROPIC, RESTRAINED
Mean Isotropic B 81.6
Anisotropic B[1][1] -5.3
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 45.44
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -40.13
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 6.82
c_mcangle_it 4.7
c_mcbond_it 3.12
c_scbond_it 4.84
c_dihedral_angle_d 20.3
c_improper_angle_d 0.73
c_bond_d 0.013
c_angle_deg 1.5
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.41
Luzzati Sigma A (Observed) 0.57
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.56
Luzzati Sigma A (R-Free Set) 0.62
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 861
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 16

Software

Software
Software Name Purpose
CNS refinement
MOSFLM data reduction
CCP4 data scaling version: (SCALA)
CNS phasing