X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 129.6 α = 90
b = 129.6 β = 90
c = 157.9 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS -- 1992
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SEALED TUBE -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 78.0 0.08 -- -- -- -- 23791 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.43 10.0 -- 2.0 -- 20822 -- 70.4 -- 0.174 0.174 0.26 --
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.6
x_bond_d 0.011
x_angle_deg 1.88
x_dihedral_angle_d 27.8
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4580
Nucleic Acid Atoms 0
Heterogen Atoms 52
Solvent Atoms 323

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
XENGEN Data Reduction (data scaling)
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement