X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.0
Details PEG 2000 MONOMETHYLETHER 22%, CALCIUM ACETATE 200mM, TRIS 10mM (pH 7), pH 7.00, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 112.81 α = 90
b = 37.5 β = 108.26
c = 85.26 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 2000-09-02
CCD ADSC QUANTUM 4 BENT CONICAL SI-MIRROR 2000-12-07
Diffraction Radiation
Monochromator Protocol
CRYOGENICALLY COOLED Si(111) SINGLE WAVELENGTH
BEND CYLINDRICAL GE(III) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1 APS 17-ID
SYNCHROTRON APS BEAMLINE 14-BM-C 1 APS 14-BM-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.54 82 96.6 0.061 -- -- 7.6 48139 48139 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.54 1.61 94.2 0.308 -- -- 5.5 4665

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.54 82.0 0.0 -- 48118 48118 2435 97.0 0.179 0.179 0.179 0.223 reflections randomly selected
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.543 1.618 5479 297 5950 0.201 0.242 -- 84.6
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 18.27
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 2.08
x_dihedral_angle_d 25.0
x_bond_d 0.012
x_angle_deg 2.4
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.21
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2878
Nucleic Acid Atoms 0
Heterogen Atoms 63
Solvent Atoms 404

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
AMORE Structure Solution
ARP/WARP, REFMAC Structure Refinement
Software
Software Name Purpose
WARP-REFMAC refinement
AMORE model building
HKL2000 data reduction
HKL2000 data collection