X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 277.0
Details 66% Saturated Ammomium Sulfate, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 79.1 α = 90
b = 85.3 β = 90
c = 92.5 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 278
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE WEISSENBERG -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6B 1.00 PHOTON FACTORY BL-6B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 9 -- -- -- -- -- 26149 26149 0.0 -- 11.5

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.8 9.0 -- -- 29084 26149 2587 89.9 -- -- 0.173 0.227 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.88 2325 224 2101 0.323 0.324 0.022 64.5
X Ray Diffraction 1.88 1.98 2751 269 2482 0.267 0.304 0.019 76.3
X Ray Diffraction 1.98 2.1 3193 303 2890 0.235 0.26 0.015 88.8
X Ray Diffraction 2.1 2.26 3424 341 3083 0.207 0.256 0.014 94.6
X Ray Diffraction 2.26 2.49 3519 375 3144 0.188 0.24 0.012 96.9
X Ray Diffraction 2.49 2.84 3555 334 3221 0.174 0.221 0.012 98.0
X Ray Diffraction 2.84 3.54 3638 353 3285 0.147 0.202 0.011 99.1
X Ray Diffraction 3.54 9.0 3744 388 3356 0.119 0.195 0.01 99.6
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.03
Anisotropic B[1][1] 0.26
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.76
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.49
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 1.04
x_torsion_deg 24.1
x_angle_deg 2.6
x_bond_d 0.015
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.19
Luzzati Sigma A (Observed) 0.32
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.23
Luzzati Sigma A (R-Free Set) 0.31
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2053
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 238

Software

Computing
Computing Package Purpose
X-PLOR Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
Crystallography & NMR System version: 1.1 refinement