X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 293.0
Details PEG 6000, EDTA, ethanol, Tris-HCl, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 44.95 α = 84.91
b = 53.11 β = 95.22
c = 32.02 γ = 108.56
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
2 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE FUJI -- 1993-01-01
IMAGE PLATE FUJI -- 1994-01-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6A 1.00 PHOTON FACTORY BL-6A
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6A 1.00 PHOTON FACTORY BL-6A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 20 85.8 0.0474 -- -- -- -- 19288 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 2.0 59.9 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 10.0 -- 2.0 -- 18779 1851 -- -- 0.199 0.199 0.216 RANDAM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 1.99 1485 161 1485 0.2751 0.2812 -- 60.0
X Ray Diffraction 1.99 2.09 1779 200 -- 0.2547 0.292 -- 74.0
X Ray Diffraction 2.09 2.22 2220 232 -- 0.2286 0.2344 -- 90.0
X Ray Diffraction 2.22 2.39 2343 252 -- 0.2111 0.2233 -- 97.0
X Ray Diffraction 2.39 2.62 2381 287 -- 0.2112 0.2224 -- 98.0
X Ray Diffraction 2.62 3.0 2393 256 -- 0.1865 0.2116 -- 98.0
X Ray Diffraction 3.0 3.74 2300 244 -- 0.1591 0.1693 -- 94.0
X Ray Diffraction 3.74 10.0 2027 219 -- 0.1944 0.2182 -- 82.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 22.6
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.39
x_dihedral_angle_d 28.74
x_angle_deg 2.66
x_bond_d 0.015
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2440
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 126

Software

Computing
Computing Package Purpose
WEIS Data Reduction (intensity integration)
PURDUE DATA PROCESSING PACKAGE Data Reduction (data scaling)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building
PURDUE version: PROGRAMS data reduction
WEIS data collection