X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.03 α = 90
b = 72.99 β = 90
c = 89.18 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 93.9 -- -- -- -- -- 37359 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.1 6.0 -- 2.0 -- 34747 -- 91.2 -- 0.196 0.196 0.232 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 23.6
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 3.13
x_scbond_it 2.93
x_mcangle_it 1.72
x_mcbond_it 1.66
x_improper_angle_d 1.46
x_bond_d 0.011
x_angle_deg 1.58
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2369
Nucleic Acid Atoms 0
Heterogen Atoms 6
Solvent Atoms 199

Software

Computing
Computing Package Purpose
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building