X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Details NATIVE CRYSTALS SOAKED IN 10MM EPANA SOLUTION, PH 7.2.

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 120.42 α = 90
b = 139.83 β = 90
c = 140.07 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 74.1 -- -- -- -- -- 35409 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.4 8.0 -- 2.0 -- 31558 -- -- -- 0.179 0.179 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 9.28
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.67
x_bond_d 0.013
x_angle_deg 1.91
x_dihedral_angle_d 26.32
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.27
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3022
Nucleic Acid Atoms 0
Heterogen Atoms 125
Solvent Atoms 79

Software

Computing
Computing Package Purpose
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building