X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 70.27 α = 90
b = 70.27 β = 90
c = 70.31 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU -- 1994-09
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 80.8 0.061 -- -- 4.1 -- 15324 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.8 10.0 -- 3.0 -- 13105 -- -- -- 0.156 0.156 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 22.4
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 9.064
x_scbond_it 5.994
x_mcangle_it 3.321
x_mcbond_it 2.325
x_bond_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1234
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 128

Software

Computing
Computing Package Purpose
MSC Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR, PROFFT Structure Refinement
Software
Software Name Purpose
PROFFT refinement
X-PLOR refinement
X-PLOR model building
MSC version: PROGRAM PACKAGE data collection