X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.3
Temperature 296.0
Details PEG 8000, citrate-phosphate buffer, sodium azide, pH 5.3, VAPOR DIFFUSION, SITTING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 112.65 α = 90
b = 137.28 β = 95.56
c = 61.89 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 296
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV MIRRORS 1997-11-15
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 40 78.0 0.064 -- -- 3.0 48693 41035 2.0 1.0 33.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.07 68.0 0.352 -- 1.3 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 40.0 1.0 2.0 48693 41035 4147 84.0 0.2614 0.196 0.196 0.296 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.13 3607 445 1904 0.3223 0.3758 -- 38.0
X Ray Diffraction 2.13 2.29 5241 584 -- 0.2921 0.3355 -- 56.0
X Ray Diffraction 2.29 2.52 6131 724 -- 0.2572 0.3162 -- 66.0
X Ray Diffraction 2.52 2.88 6962 760 -- 0.2345 0.3295 -- 73.0
X Ray Diffraction 2.88 3.63 7660 819 -- 0.1816 0.2818 -- 80.0
X Ray Diffraction 3.63 40.0 7287 815 -- 0.143 0.2696 -- 77.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 35.5
RMS Deviations
Key Refinement Restraint Deviation
x_mcangle_it 2.0
x_dihedral_angle_d 24.3
x_angle_deg 1.4
x_bond_d 0.007
x_scbond_it 2.0
x_improper_angle_d 1.3
x_scangle_it 2.5
x_mcbond_it 1.5
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Luzzati Resolution Cutoff (Low) 10.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6696
Nucleic Acid Atoms 0
Heterogen Atoms 89
Solvent Atoms 529

Software

Software
Software Name Purpose
X-PLOR model building
X-PLOR refinement version: 3.851
SCALEPACK data scaling
X-PLOR phasing