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X-RAY DIFFRACTION
Materials and Methods page
1IIM
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 298.0
    Details Tris, Mono-ammonium dihydrogen phosphate, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 120.06 α = 90
    b = 120.06 β = 90
    c = 94.41 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 120
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV
    Details mirrors
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Resolution(High) 2.01
    Resolution(Low) 19.26
    Number Reflections(All) 45400
    B(Isotropic) From Wilson Plot 18.8
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.1
    Resolution(Low) 19.26
    Number of Reflections(all) 40746
    Number of Reflections(Observed) 39043
    Number of Reflections(R-Free) 3893
    Percent Reflections(Observed) 95.8
    R-Work 0.198
    R-Free 0.235
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.92
    Anisotropic B[1][1] -0.69
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.69
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.38
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.2
    Number of Reflections(Observed) 4603
    Number of Reflections(R-Free) 440
    Number of Reflections(R-Work) 4163
    R-Factor(R-Work) 0.268
    R-Factor(R-Free) 0.269
    R-Free Error 0.013
    Percent Reflections(Observed) 91.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.31
    Number of Reflections(Observed) 4679
    Number of Reflections(R-Free) 455
    Number of Reflections(R-Work) 4224
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.249
    R-Free Error 0.012
    Percent Reflections(Observed) 92.7
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.31
    Shell Resolution(Low) 2.46
    Number of Reflections(Observed) 4821
    Number of Reflections(R-Free) 486
    Number of Reflections(R-Work) 4335
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.223
    R-Free Error 0.01
    Percent Reflections(Observed) 96.2
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.46
    Shell Resolution(Low) 2.64
    Number of Reflections(Observed) 4920
    Number of Reflections(R-Free) 495
    Number of Reflections(R-Work) 4425
    R-Factor(R-Work) 0.208
    R-Factor(R-Free) 0.208
    R-Free Error 0.009
    Percent Reflections(Observed) 97.7
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.64
    Shell Resolution(Low) 2.91
    Number of Reflections(Observed) 4967
    Number of Reflections(R-Free) 509
    Number of Reflections(R-Work) 4458
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.213
    R-Free Error 0.009
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.91
    Shell Resolution(Low) 3.33
    Number of Reflections(Observed) 5015
    Number of Reflections(R-Free) 519
    Number of Reflections(R-Work) 4496
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.213
    R-Free Error 0.009
    Percent Reflections(Observed) 98.3
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.33
    Shell Resolution(Low) 4.19
    Number of Reflections(Observed) 4865
    Number of Reflections(R-Free) 498
    Number of Reflections(R-Work) 4367
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.181
    R-Free Error 0.008
    Percent Reflections(Observed) 94.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.19
    Shell Resolution(Low) 19.26
    Number of Reflections(Observed) 5173
    Number of Reflections(R-Free) 491
    Number of Reflections(R-Work) 4682
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.193
    R-Free Error 0.009
    Percent Reflections(Observed) 96.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_torsion_impr_deg 0.86
    x_torsion_deg 22.8
    x_angle_deg 1.6
    x_bond_d 0.009
     
    Coordinate Error
    Luzzati ESD(Observed) 0.24
    Luzzati Sigma A(Observed) 0.22
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.23
    Luzzati Sigma A(R-Free Set) 0.19
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4514
    Nucleic Acid Atoms 0
    Heterogen Atoms 116
    Solvent Atoms 385
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AMORE
    Structure Refinement CNS 1.0
     
    Software
    refinement Crystallography & NMR System version: 1.0