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X-RAY DIFFRACTION
Materials and Methods page
1IGT
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Temperature 291.0
    Details 7 MICROLITERS OF 4.3 MG/ML MAB231, 3 MICROLITERS 50 MILLIMOLAR TRIS PH 8.0, AND 7 MICROLITERS 4% PEG 3350 EQUILIBRATED AGAINST 25 ML RESERVOIRS OF 4% PEG 3350, AT 18 DEGREE CELSIUS (SANDWICH PLATE)., temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.82 α = 88.05
    b = 76.77 β = 92.35
    c = 100.64 γ = 97.23
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 291
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type XUONG-HAMLIN MULTIWIRE
    Collection Date 1992-11
     
    Diffraction Radiation
    Monochromator SUPPER GRAPHITE CRYSTAL ASYMMETRIC CUT TRIANGULAR BENT CRYSTAL (SI-111)
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU200
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.8
    Resolution(Low) 76.1
    Number Reflections(Observed) 47595
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 45.5
    Redundancy 4.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 20.0
    Cut-off Sigma(F) 4.0
    Number of Reflections(Observed) 41371
    Number of Reflections(R-Free) 4149
    Percent Reflections(Observed) 86.2
    R-Factor(Observed) 0.209
    R-Work 0.209
    R-Free 0.297
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 52.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8
    Shell Resolution(Low) 2.97
    Number of Reflections(R-Free) 487
    Number of Reflections(R-Work) 4482
    R-Factor(R-Work) 0.322
    R-Factor(R-Free) 0.417
    R-Free Error 0.019
    Percent Reflections(Observed) 62.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 11.39
    x_scbond_it 7.88
    x_mcangle_it 9.6
    x_mcbond_it 5.9
    x_improper_angle_d 1.4
    x_bond_d 0.009
    x_angle_deg 1.6
    x_dihedral_angle_d 27.1
     
    Coordinate Error
    Luzzati ESD(Observed) 0.34
    Luzzati Sigma A(Observed) 0.56
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.48
    Luzzati Sigma A(R-Free Set) 0.8
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10214
    Nucleic Acid Atoms 0
    Heterogen Atoms 220
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XENGEN (HOWARD, NIELSEN, XUONG)
    Data Reduction (data scaling) XENGEN (HOWARD, NIELSEN, XUONG)
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data reduction NIELSEN
    data reduction HOWARD
    data collection NIELSEN
    data collection HOWARD