X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 78.45 α = 90
b = 78.45 β = 90
c = 158.07 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC -- 1994-03-26
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 76.0 0.038 -- -- -- -- 27190 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 5.0 -- 3.0 -- 20014 -- 76.0 -- 0.17 0.17 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 32.0
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.344
x_angle_deg 1.4
x_dihedral_angle_d 23.76
x_bond_d 0.01
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.25
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2570
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 109

Software

Software
Software Name Purpose
X-PLOR refinement version: 3.1
PROCESS data reduction