X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Hangman Hanging Drop Crystallization Method
pH 4.9
Temperature 293.0
Details 55% AMMONIUM SULFATE; 0.1 M PHOSPHATE BUFFER, pH 4.9, HANGMAN HANGING DROP CRYSTALLIZATION METHOD, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 76.69 α = 90
b = 96.66 β = 106.84
c = 81.74 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS II COLLIMATOR --
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 96.66 61.4 0.098 38.6 -- 1.62 14537 23667 0.0 0.0 12.5
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.1 59.6 0.231 -- 2.6 1.69 1267

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.0 15.0 0.0 0.0 22820 14405 899 63.1 -- 0.229 0.229 0.289 SHELLS
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0 3.16 1946 135 735 0.373 0.4484 0.077 59.1
X Ray Diffraction 3.16 3.35 2031 93 -- 0.2827 0.3181 -- --
X Ray Diffraction 3.35 3.61 2101 132 -- 0.2513 0.3427 -- --
X Ray Diffraction 3.61 3.96 2100 135 -- 0.2138 0.2555 -- --
X Ray Diffraction 3.96 4.52 2031 135 -- 0.1693 0.2269 -- --
X Ray Diffraction 4.52 5.65 2092 134 -- 0.1791 0.2555 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model GROUP
Mean Isotropic B 22.5
Anisotropic B[1][1] 0.0
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.0
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.0
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 1.14
c_dihedral_angle_d 26.4
c_angle_deg 1.4
c_bond_d 0.007
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.37
Luzzati Sigma A (Observed) 0.61
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.43
Luzzati Sigma A (R-Free Set) 0.74
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7168
Nucleic Acid Atoms 0
Heterogen Atoms 48
Solvent Atoms 0

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
R-AXIS Data Reduction (data scaling)
X-PLOR Structure Solution
CNS 1.0 Structure Refinement
Software
Software Name Purpose
CNS version: 1.0 refinement
X-PLOR model building