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X-RAY DIFFRACTION
Materials and Methods page
1ICT
  •   Crystallization Hide
    Crystallization Experiments
    Method HANGMAN HANGING DROP CRYSTALLIZATION METHOD
    pH 4.9
    Temperature 293.0
    Details 55% AMMONIUM SULFATE; 0.1 M PHOSPHATE BUFFER, pH 4.9, HANGMAN HANGING DROP CRYSTALLIZATION METHOD, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 76.69 α = 90
    b = 96.66 β = 106.84
    c = 81.74 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 293
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS II
    Details COLLIMATOR
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU200
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3
    Resolution(Low) 96.66
    Number Reflections(All) 14537
    Number Reflections(Observed) 23667
    Percent Possible(Observed) 61.4
    R Merge I(Observed) 0.098
    B(Isotropic) From Wilson Plot 12.5
    Redundancy 1.62
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.1
    Percent Possible(All) 59.6
    R Merge I(Observed) 0.231
    Mean I Over Sigma(Observed) 2.6
    Redundancy 1.69
    Number Unique Reflections(All) 1267
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 15.0
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22820
    Number of Reflections(Observed) 14405
    Number of Reflections(R-Free) 899
    Percent Reflections(Observed) 63.1
    R-Factor(Observed) 0.229
    R-Work 0.229
    R-Free 0.289
    R-Free Selection Details SHELLS
     
    Temperature Factor Modeling
    Isotropic Thermal Model GROUP
    Mean Isotropic B Value 22.5
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.16
    Number of Reflections(Observed) 1946
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 735
    R-Factor(R-Work) 0.373
    R-Factor(R-Free) 0.4484
    R-Free Error 0.077
    Percent Reflections(Observed) 59.1
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.16
    Shell Resolution(Low) 3.35
    Number of Reflections(Observed) 2031
    Number of Reflections(R-Free) 93
    R-Factor(R-Work) 0.2827
    R-Factor(R-Free) 0.3181
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.35
    Shell Resolution(Low) 3.61
    Number of Reflections(Observed) 2101
    Number of Reflections(R-Free) 132
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.3427
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.61
    Shell Resolution(Low) 3.96
    Number of Reflections(Observed) 2100
    Number of Reflections(R-Free) 135
    R-Factor(R-Work) 0.2138
    R-Factor(R-Free) 0.2555
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.96
    Shell Resolution(Low) 4.52
    Number of Reflections(Observed) 2031
    Number of Reflections(R-Free) 135
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.2269
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.52
    Shell Resolution(Low) 5.65
    Number of Reflections(Observed) 2092
    Number of Reflections(R-Free) 134
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2555
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_d 1.14
    c_dihedral_angle_d 26.4
    c_angle_deg 1.4
    c_bond_d 0.007
     
    Coordinate Error
    Luzzati ESD(Observed) 0.37
    Luzzati Sigma A(Observed) 0.61
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.43
    Luzzati Sigma A(R-Free Set) 0.74
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7168
    Nucleic Acid Atoms 0
    Heterogen Atoms 48
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Data Reduction (data scaling) R-AXIS
    Structure Solution X-PLOR
    Structure Refinement CNS 1.0
     
    Software
    refinement CNS version: 1.0
    model building X-PLOR