X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5
Temperature 295.0
Details 2 M ammonium sulfate, 0.1 M sodium acetate, pH 5, VAPOR DIFFUSION, SITTING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 171.84 α = 90
b = 171.84 β = 90
c = 144.57 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 173
2 173
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2000-03-23
CCD ADSC QUANTUM 4 -- 1999-09-21
Diffraction Radiation
Monochromator Protocol
NSLS X8C beamline optics SINGLE WAVELENGTH
NSLS X12B beamline optics SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 0.979 NSLS X8C
SYNCHROTRON NSLS BEAMLINE X12B 0.978 NSLS X12B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 28 99.0 0.079 -- -- 6.8 72520 72520 0.0 0.0 23.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.18 96.0 0.294 -- 3.6 3.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.1 27.66 0.0 0.0 72520 72520 7190 98.8 0.229 0.2203 0.2203 0.2583 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.23 -- 1082 10614 0.2725 0.3023 0.009 97.1
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 38.5
Anisotropic B[1][1] 3.79
Anisotropic B[1][2] 1.06
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 3.79
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -7.57
RMS Deviations
Key Refinement Restraint Deviation
c_mcbond_it 1.33
c_angle_deg 1.62386
c_bond_d 0.011155
c_scangle_it 2.93
c_improper_angle_d 0.99896
c_dihedral_angle_d 27.3744
c_scbond_it 2.09
c_mcangle_it 2.05
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.28
Luzzati Sigma A (Observed) 0.24
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.33
Luzzati Sigma A (R-Free Set) 0.27
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6414
Nucleic Acid Atoms 121
Heterogen Atoms 5
Solvent Atoms 339

Software

Software
Software Name Purpose
SCALEPACK data scaling
AMoRE phasing
X-PLOR model building
CNS refinement version: 1.0
X-PLOR phasing