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X-RAY DIFFRACTION
Materials and Methods page
1HXW
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.06 α = 90
    b = 86.88 β = 90
    c = 46.62 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Collection Date 1994-04-20
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.8
    Number Reflections(Observed) 18726
    Percent Possible(Observed) 78.7
    R Merge I(Observed) 0.0434
    Redundancy 2.8
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.8
    Resolution(Low) 10.0
    Cut-off Sigma(F) 2.0
    R-Factor(Observed) 0.201
    R-Work 0.201
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.7
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1520
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 100
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Data Reduction (data scaling) R-AXIS
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR