X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 298.0
Details PEG 6000, MPD, Tris, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 68.81 α = 90
b = 109.62 β = 90
c = 138.28 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 bent cylindrical Si-mirror (Rh coating) bend cylindrical Ge(111) monochromator 2000-05-27
Diffraction Radiation
Monochromator Protocol
bend cylindrical Ge(111) monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-C 1.0 APS 14-BM-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 85.9 88.9 0.088 -- -- 5.8 158223 148337 0.0 0.0 14.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.55 56.0 0.331 -- 3.3 2.5 9246

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.5 85.9 1.0 1.0 167398 145650 6888 87.0 -- -- 0.197 0.216 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.57 10705 364 10341 0.256 0.275 0.013 51.6
X Ray Diffraction 1.57 1.65 14104 536 13568 0.224 0.238 0.01 68.0
X Ray Diffraction 1.65 1.75 17933 810 17123 0.212 0.244 0.007 86.0
X Ray Diffraction 1.75 1.89 19753 979 18774 0.202 0.233 0.006 94.9
X Ray Diffraction 1.89 2.08 20425 1010 19415 0.196 0.216 0.006 97.8
X Ray Diffraction 2.08 2.38 20759 1035 19724 0.194 0.213 0.006 99.1
X Ray Diffraction 2.38 3.0 20971 1068 19903 0.196 0.214 0.006 99.6
X Ray Diffraction 3.0 85.9 21000 1086 19914 0.186 0.204 0.006 97.2
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 15.87
Anisotropic B[1][1] 0.05
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.24
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.29
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.006
c_angle_deg 1.3
c_dihedral_angle_d 24.19
c_improper_angle_d 0.801
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.16
Luzzati Sigma A (Observed) 0.11
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.18
Luzzati Sigma A (R-Free Set) 0.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8181
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 983

Software

Software
Software Name Purpose
CNS refinement version: 1.0
DENZO data reduction
SCALEPACK data scaling
CNS phasing