X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.3 α = 90
b = 57.36 β = 90
c = 82.68 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR ENRAF-NONIUS FAST -- 1993-11-15
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 92.0 0.082 -- -- 3.9 -- 9453 -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 8.0 -- 0.0 -- 9145 -- 92.7 -- 0.144 0.144 0.244 --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.015
x_angle_deg 3.1
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.25
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2087
Nucleic Acid Atoms 0
Heterogen Atoms 43
Solvent Atoms 204

Software

Computing
Computing Package Purpose
MADNES Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building
MADNES data collection