X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 290.0
Details HiPIP (20mg/ml, 20mM Tris pH 8, 2mM Beta-mercaptoethanol, 3.2M (NH4)2SO4 in 100mM Tris buffer, VAPOR DIFFUSION, HANGING DROP, temperature 290K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 88.31 α = 90
b = 88.31 β = 90
c = 61.34 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH mirrors 1997-06-09
IMAGE PLATE MARRESEARCH mirrors 1997-04-23
Diffraction Radiation
Monochromator Protocol
Channel cut Si(111) MAD
Asymmetric cut Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7A 1.738, 1.742, 0.995 EMBL/DESY, HAMBURG BW7A
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7B 1.105 EMBL/DESY, HAMBURG BW7B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 22.09 99.0 0.047 -- -- 5.6 42975 42975 0.0 0.0 17.254
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.45 1.53 95.4 0.412 -- 0.6 3.8 5912

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.45 22.0 0.0 0.0 42733 42733 2151 99.6 0.186 0.186 0.187 0.218 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.453 1.604 10629 -- -- 0.19 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Anisotropic
RMS Deviations
Key Refinement Restraint Deviation
p_transverse_tor 15.8
p_staggered_tor 13.9
p_planar_tor 8.4
p_bond_d 0.008
p_angle_d 0.026
p_planar_d 0.068
p_mcbond_it 1.311
p_mcangle_it 1.908
p_scbond_it 1.508
p_scangle_it 2.079
p_plane_restr 8.4
p_chiral_restr 0.098
p_singtor_nbd 0.157
p_multtor_nbd 0.259
p_xyhbond_nbd 0.124
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.0777
Luzzati Resolution Cutoff (Low) 22.0
Luzzati ESD (R-Free Set) 0.0766
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1637
Nucleic Acid Atoms 0
Heterogen Atoms 49
Solvent Atoms 260

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
CCP4 (SCALA) Data Reduction (data scaling)
SHARP Structure Solution
REFMAC Structure Refinement
Software
Software Name Purpose
REFMAC refinement
SHARP model building
SCALA data reduction
MOSFLM data collection