X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 290.0
Details HiPIP (20mg/ml, 20mM Tris pH 8, 2mM Beta-mercaptoethanol, 3.2M (NH4)2SO4 in 100mM Tris buffer, VAPOR DIFFUSION, HANGING DROP, temperature 290K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 88.31 α = 90
b = 88.31 β = 90
c = 61.34 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH mirrors 1997-06-09
IMAGE PLATE MARRESEARCH mirrors 1997-04-23
Diffraction Radiation
Monochromator Protocol
Channel cut Si(111) MAD
Asymmetric cut Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7A 1.738, 1.742, 0.995 EMBL/DESY, Hamburg BW7A
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7B 1.105 EMBL/DESY, Hamburg BW7B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 22.09 99.0 0.047 -- -- 5.6 42975 42975 0.0 0.0 17.254
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.45 1.53 95.4 0.412 -- 0.6 3.8 5912

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.45 22.0 0.0 0.0 42733 42733 2151 99.6 0.186 0.186 0.187 0.218 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.453 1.604 10629 -- -- 0.19 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Anisotropic
RMS Deviations
Key Refinement Restraint Deviation
p_xyhbond_nbd 0.124
p_singtor_nbd 0.157
p_angle_d 0.026
p_multtor_nbd 0.259
p_scbond_it 1.508
p_planar_d 0.068
p_scangle_it 2.079
p_mcbond_it 1.311
p_planar_tor 8.4
p_transverse_tor 15.8
p_staggered_tor 13.9
p_chiral_restr 0.098
p_plane_restr 8.4
p_bond_d 0.008
p_mcangle_it 1.908
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.0777
Luzzati Resolution Cutoff (Low) 22.0
Luzzati ESD (R-Free Set) 0.0766
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1688
Nucleic Acid Atoms 0
Heterogen Atoms 54
Solvent Atoms 281

Software

Software
Software Name Purpose
MOSFLM data reduction
SCALA data scaling
SHARP phasing
REFMAC refinement
CCP4 data scaling version: (SCALA)