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X-RAY DIFFRACTION
Materials and Methods page
1HCK
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.82 α = 90
    b = 72.66 β = 90
    c = 54.07 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS II
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(Observed) 22636
    Percent Possible(Observed) 97.3
    R Merge I(Observed) 0.067
    Redundancy 3.6
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.9
    Resolution(Low) 8.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 19547
    Percent Reflections(Observed) 98.0
    R-Factor(Observed) 0.185
    R-Work 0.185
    R-Free 0.272
     
    Temperature Factor Modeling
    Mean Isotropic B Value 37.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.58
    x_bond_d 0.012
    x_angle_deg 1.78
    x_dihedral_angle_d 24.58
     
    Coordinate Error
    Luzzati ESD(Observed) 0.23
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2366
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 108
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1