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X-RAY DIFFRACTION
Materials and Methods page
1H9N
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 2M (NH4)2SO4; 100 MM TRIS PH 8.0; 5 MM N-HEXYL BETA-D-GLUCOPYRANOSIDE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.7 α = 90
    b = 41.7 β = 104.6
    c = 73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 287
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IIC
    Details MIRRORS
    Collection Date 1995-09
     
    Diffraction Radiation
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.85
    Resolution(Low) 20
    Number Reflections(Observed) 19942
    Percent Possible(Observed) 93.0
    R Merge I(Observed) 0.074
    B(Isotropic) From Wilson Plot 23.4
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.9
    Percent Possible(All) 81.0
    R Merge I(Observed) 0.236
    Mean I Over Sigma(Observed) 2.9
    R-Sym I(Observed) 0.236
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method DIFFERENCE FOURIER
    reflnsShellList 1.85
    Resolution(Low) 20.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 19972
    Number of Reflections(R-Free) 957
    Percent Reflections(Observed) 92.0
    R-Factor(Observed) 0.17
    R-Work 0.17
    R-Free 0.236
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 23.1
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.93
    Number of Reflections(R-Free) 101
    Number of Reflections(R-Work) 2311
    R-Factor(R-Work) 0.279
    R-Factor(R-Free) 0.302
    R-Free Error 0.03
    Percent Reflections(Observed) 87.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 0.96
    x_scbond_it 0.59
    x_mcangle_it 0.96
    x_mcbond_it 0.59
    x_improper_angle_d 1.4
    x_bond_d 0.009
    x_angle_deg 1.6
    x_dihedral_angle_d 25.4
     
    Coordinate Error
    Luzzati ESD(Observed) 0.2
    Luzzati Sigma A(Observed) 0.2
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.27
    Luzzati Sigma A(R-Free Set) 0.15
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2046
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 181
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) CCP4
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR