X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6
Details pH 6.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.96 α = 90
b = 84.99 β = 90
c = 215.38 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 290
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- 1997-04
Diffraction Radiation
Monochromator Protocol
GRAPHITE(002) --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.68 12.35 98.0 0.058 -- -- 2.0 -- 26217 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.68 2.9 87.1 0.155 -- -- 1.75 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.68 10.0 -- 2.0 -- 23012 2268 77.8 -- 0.211 0.211 0.245 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.68 2.8 -- 139 1316 0.245 0.28 0.01 40.1
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 4.0
x_scbond_it 2.57
x_mcangle_it 2.56
x_mcbond_it 1.54
x_improper_angle_d 1.41
x_bond_d 0.012
x_angle_deg 1.32
x_dihedral_angle_d 22.02
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.27
Luzzati Resolution Cutoff (Low) 10.0
Luzzati ESD (R-Free Set) 0.33
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7216
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 63

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
X-PLOR 3.851 Structure Solution
X-PLOR 3.851 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.851 refinement
X-PLOR version: 3.851 model building