X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 167.2 α = 90
b = 167.2 β = 90
c = 172.9 γ = 90
Symmetry
Space Group P 42 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1994-09
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX9.5 -- SRS PX9.5

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 93.2 0.043 -- -- 2.6 -- 115181 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 10.0 -- -- -- 113882 -- 93.2 -- -- 0.174 -- --
RMS Deviations
Key Refinement Restraint Deviation
t_gen_planes 0.018
t_angle_deg 2.843
t_bond_d 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9876
Nucleic Acid Atoms 0
Heterogen Atoms 30
Solvent Atoms 318

Software

Software
Software Name Purpose
TNT refinement
MOSFLM data reduction