X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 101.8 α = 90
b = 95.6 β = 92.2
c = 105.3 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS -- 1993-10-21
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 10 94.7 0.078 -- -- 1.6 -- 26072 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.7 7.5 -- 0.0 -- 24937 -- 94.9 -- 0.229 0.229 0.261 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 43.0
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.31
x_bond_d 0.01
x_angle_deg 1.46
x_dihedral_angle_d 21.5
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.35
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7184
Nucleic Acid Atoms 0
Heterogen Atoms 76
Solvent Atoms 150

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building