X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.36 α = 90
b = 42.66 β = 90
c = 39.9 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE FUJI -- 1994-01-04
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A -- NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 40 -- 0.054 -- -- 15.1 -- 8079 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 6.0 -- 1.0 -- 8040 -- 86.0 -- 0.209 0.209 0.32 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.4
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 2.5
x_scbond_it 2.0
x_mcangle_it 2.0
x_mcbond_it 1.5
x_bond_d 0.018
x_angle_deg 2.1
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1190
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 98

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building