X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 35.32 α = 90
b = 39.67 β = 98.38
c = 36.97 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS -- 1993-07-15
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 74.0 0.0454 -- -- 2.0 -- 7053 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.8 -- -- 0.0 -- 7053 -- -- -- 0.175 -- -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 42.0
RMS Deviations
Key Refinement Restraint Deviation
t_angle_deg 2.4
t_bond_d 0.013
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 814
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 48

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
X-PLOR Structure Solution
TNT, X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
TNT refinement
X-PLOR model building