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X-RAY DIFFRACTION
Materials and Methods page
1GCL
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.43 α = 90
    b = 48.63 β = 90
    c = 51.76 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS
    Collection Date 1992
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Number Reflections(Observed) 5643
    Percent Possible(Observed) 73.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.1
    Cut-off Sigma(F) 5.0
    Number of Reflections(Observed) 5266
    R-Factor(Observed) 0.152
     
    Temperature Factor Modeling
    Mean Isotropic B Value 40.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_angle_deg 2.9
    t_bond_d 0.018
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1060
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 77
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Structure Solution X-PLOR
    Structure Refinement TNT, X-PLOR
     
    Software
    refinement X-PLOR
    refinement TNT
    model building X-PLOR