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X-RAY DIFFRACTION
Materials and Methods page
1GBU
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.02 α = 90
    b = 82.94 β = 99.16
    c = 53.83 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector AREA DETECTOR
    Type SIEMENS
    Collection Date 1994-11-20
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.8
    Resolution(Low) 6
    Number Reflections(Observed) 41926
    Percent Possible(Observed) 82.7
    Redundancy 3.13
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.8
    Resolution(Low) 6.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 41926
    Percent Reflections(Observed) 82.7
    R-Work 0.167
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.51
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    p_transverse_tor 32.0
    p_staggered_tor 18.1
    p_planar_tor 3.5
    p_xyhbond_nbd 0.228
    p_multtor_nbd 0.184
    p_bond_d 0.021
    p_angle_d 0.038
    p_planar_d 0.045
    p_mcbond_it 0.98
    p_mcangle_it 1.465
    p_scbond_it 1.881
    p_scangle_it 2.779
    p_plane_restr 0.024
    p_chiral_restr 0.233
    p_singtor_nbd 0.191
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4378
    Nucleic Acid Atoms 0
    Heterogen Atoms 182
    Solvent Atoms 452
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XENGEN
    Structure Refinement GPRLSA, PROLSQ
     
    Software
    refinement PROLSQ
    refinement GPRLSA