X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.58 α = 90
b = 66.58 β = 90
c = 80.2 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
DIFFRACTOMETER RIGAKU -- 1994-09-25
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 17.5 75.0 -- -- -- -- -- 6917 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.3 17.5 -- 2.0 -- 6777 -- -- -- 0.135 0.135 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.12
x_bond_d 0.016
x_angle_deg 2.8
x_dihedral_angle_d 25.7
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1420
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 162

Software

Computing
Computing Package Purpose
RIGAKU AFC5 CONTROL SOFTWARE Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building
RIGAKU version: AFC5 CONTROL SOFTWARE data collection