X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.15 α = 90
b = 66.15 β = 90
c = 80.05 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
DIFFRACTOMETER RIGAKU AFC-6R -- 1994-06-28
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 17.5 87.0 -- -- -- -- -- 8536 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.3 17.5 -- 2.0 -- 8333 -- -- -- 0.141 0.141 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 2.9
x_dihedral_angle_d 26.1
x_bond_d 0.016
x_improper_angle_d 1.33
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1392
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 173

Software

Software
Software Name Purpose
RIGAKU data collection version: AFC5 CONTROL SOFTWARE PLUS BACKGROUND CORRECTION BY THE METHOD OF KRIEGER ET AL.
X-PLOR model building version: 3.1
X-PLOR refinement version: 3.1
RIGAKU data reduction version: AFC5 CONTROL SOFTWARE PLUS BACKGROUND CORRECTION BY THE METHOD OF KRIEGER ET AL.
X-PLOR phasing version: 3.1