X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.2
Temperature 293.0
Details 5% guanidine, 7% glycerol, 5% methanol, 1.0 M ammonium sulfate, 0.1 M sodium citrate buffer pH 5.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 97.4 α = 90
b = 97.4 β = 90
c = 83.35 γ = 120
Symmetry
Space Group P 62

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 focussing mirror 2000-08-03
Diffraction Radiation
Monochromator Protocol
Si(111) double crystal, sagitally focussing SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 0.98 NSLS X9B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1 10 84.0 0.054 -- -- 10.6 241182 202008 -3.0 -3.0 6.58
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.0 1.04 10.0 0.477 -- 4.7 10.6 24057

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
ISOMORPHOUS WITH 1GA1 1.0 10.0 -3.0 -3.0 240885 202008 3540 83.9 0.1147 0.0994 0.1234 0.1308 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.0 10.0 240885 3540 -- 0.1147 0.1308 -- 84.0
RMS Deviations
Key Refinement Restraint Deviation
s_bond_d 0.015
s_angle_d 0.03
s_zero_chiral_vol 0.104
s_from_restr_planes 0.03
s_approx_iso_adps 0.092
s_non_zero_chiral_vol 0.125
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2712
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 466

Software

Software
Software Name Purpose
HKL-2000 data collection
HKL-2000 data reduction
SHELXL-97 refinement
HKL-2000 data scaling