X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help


Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 0.1 M sodium chloride, 5 mM calcium chloride, 1.4 M lithium sulfate, 0.1 M Tris buffer pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 97.19 α = 90
b = 97.19 β = 90
c = 83.37 γ = 120
Space Group P 62


Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 focussing mirror 2000-05-03
Diffraction Radiation
Monochromator Protocol
Si(111) double crystal, sagitally focussing SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline

Data Collection

Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 30 99.9 0.036 -- -- 7.7 87947 87947 -3.0 -3.0 12.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.4 1.45 99.5 0.216 -- 7.0 7.7 8711


Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SINGLE-WAVELENGTH ANOMALOUS DIFFRACTION 1.4 30.0 -999.0 -999.0 87947 81364 8107 -- 0.1129 0.108 0.113 0.1358 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 30.0 87947 8801 -- 0.1129 0.1358 -- 93.0
RMS Deviations
Key Refinement Restraint Deviation
s_non_zero_chiral_vol 0.089
s_zero_chiral_vol 0.079
s_from_restr_planes 0.028
s_angle_d 0.029
s_bond_d 0.013
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2726
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 422


Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHELXD, SHARP, DM, ARP/WARP Structure Solution
SHELXL-97 Structure Refinement
Software Name Purpose
SHELXL-97 refinement
WARP model building
DM model building
SHARP model building
SHELXD model building
HKL2000 data reduction
HKL2000 data collection