X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.0
Details MPD, Hepes, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.33 α = 90
b = 138.68 β = 90
c = 114.81 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 277
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD THOMSON/PRINCETON -- 1996-02-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE D2AM 0.9828 ESRF D2AM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 44.28 82.2 0.064 -- -- 1.7 43621 43621 1.0 1.0 22.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.9 54.2 0.297 -- 2.4 1.3 4168

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.8 44.28 0.0 0.0 43621 43553 4227 82.2 -- -- 0.168 0.2009 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.88 2550 277 -- 0.365 0.381 -- --
X Ray Diffraction 1.88 1.98 3696 403 -- 0.295 0.318 -- --
X Ray Diffraction 1.98 2.11 4251 488 -- 0.244 0.274 -- --
X Ray Diffraction 2.11 2.27 4723 499 -- 0.212 0.235 -- --
X Ray Diffraction 2.27 2.5 5149 588 -- 0.195 0.249 -- --
X Ray Diffraction 2.5 2.86 5524 618 -- 0.172 0.204 -- --
X Ray Diffraction 2.86 3.6 5749 688 -- 0.138 0.174 -- --
X Ray Diffraction 3.6 44.28 6034 666 -- 0.12 0.15 -- --
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
RMS Deviations
Key Refinement Restraint Deviation
x_angle_d 1.597
x_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3448
Nucleic Acid Atoms 0
Heterogen Atoms 43
Solvent Atoms 274

Software

Computing
Computing Package Purpose
MARXDS Data Reduction (intensity integration)
CCP4 (AGROVATA, ROTAVATA) Data Reduction (data scaling)
X-PLOR Structure Solution
X-PLOR 3.843 Structure Refinement
Software
Software Name Purpose
ROTAVATA-AGROVATA data reduction
MARXDS data collection
X-PLOR model building
X-PLOR version: 3.843 refinement