X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.4
Temperature 291.0
Details 100 mM MES/NaOH 30% MPD , pH 6.4, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 164.68 α = 90
b = 110.03 β = 90.35
c = 152.87 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 90
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH Double focussing X-ray optics 1998-01-25
Diffraction Radiation
Monochromator Protocol
double crystal monochromator, Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MPG/DESY, HAMBURG BEAMLINE BW6 1.09 MPG/DESY, HAMBURG BW6

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 20 87.1 0.058 5.8 -- 2.6 213488 213488 -- -- 28.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.56 73.3 0.248 24.8 2.8 2.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR 2.5 14.99 -- -- 81936 81936 4087 87.1 -- 0.23 0.23 0.263 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.59 -- 343 6560 0.294 0.369 0.02 73.9
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 39.2
Anisotropic B[1][1] 5.35
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.71
Anisotropic B[2][2] 5.84
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -11.19
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.008
c_scangle_it 2.6
c_scbond_it 1.73
c_angle_deg 1.3
c_dihedral_angle_d 22.7
c_mcbond_it 1.24
c_mcangle_it 2.09
c_improper_angle_d 0.91
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.35
Luzzati Sigma A (Observed) 0.3
Luzzati Resolution Cutoff (Low) 25.0
Luzzati ESD (R-Free Set) 0.41
Luzzati Sigma A (R-Free Set) 0.39
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 15972
Nucleic Acid Atoms 0
Heterogen Atoms 372
Solvent Atoms 416

Software

Software
Software Name Purpose
CCP4 model building
CNS refinement version: 1.0
MOSFLM data reduction
CCP4 data scaling version: (AGROVATA
ROTAVATA data scaling
CCP4 phasing