X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.5
Details pH 7.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 117.7 α = 90
b = 65.1 β = 126.3
c = 76.4 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 289
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU YALE MIRRORS 1995-07-10
Diffraction Radiation
Monochromator Protocol
GRAPHITE(002) --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 90.5 0.0635 -- -- 2.8 -- 46502 -- 0.3 21.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.78 84.1 0.328 -- 2.36 1.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR 1.7 50.0 -- 1.0 -- 46502 4483 90.5 -- 0.198 0.198 0.231 YES
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.78 -- 545 4478 0.398 0.4 -- 78.3
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 33.1
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 1.39
x_bond_d 0.006
x_improper_angle_d 1.06
x_dihedral_angle_d 21.86
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.22
Luzzati Resolution Cutoff (Low) 50.0
Luzzati ESD (R-Free Set) 0.275
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2904
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 248

Software

Computing
Computing Package Purpose
RIGAKU Data Reduction (intensity integration)
RIGAKU Data Reduction (data scaling)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
RIGAKU version: SOFTWARE data reduction
RIGAKU version: SOFTWARE data collection
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building