X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6.5
Details pH 6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 117.7 α = 90
b = 65.1 β = 126.3
c = 76.4 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 289
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU -- 1993-11-05
Diffraction Radiation
Monochromator Protocol
GRAPHITE(002) --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.06 50 91.0 0.0558 -- -- 2.8 -- 26334 -- 3.0 26.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.06 2.25 84.1 0.219 -- 3.89 1.98 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
DIFFERENCE FOURIER 2.06 50.0 -- 1.0 -- 26334 2607 91.0 -- 0.18 0.18 0.218 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.06 2.15 -- 291 2644 0.283 0.297 -- 81.2
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 35.9
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.03
x_bond_d 0.007
x_angle_deg 1.38
x_dihedral_angle_d 21.98
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.26
Luzzati Resolution Cutoff (Low) 50.0
Luzzati ESD (R-Free Set) 0.285
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2904
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 160

Software

Computing
Computing Package Purpose
R-AXIS Data Reduction (intensity integration)
R-AXIS Data Reduction (data scaling)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building
R-AXIS version: SOFTWARE data reduction
R-AXIS version: SOFTWARE data collection