X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 104 α = 90
b = 219.9 β = 90
c = 86.7 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 294
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- 1995
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.98 8.0 -- -- -- 63157 -- -- -- 0.165 0.165 0.206 --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.007
x_improper_angle_d 1.269
x_dihedral_angle_d 21.05
x_angle_deg 1.261
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6911
Nucleic Acid Atoms 0
Heterogen Atoms 44
Solvent Atoms 434

Software

Software
Software Name Purpose
X-PLOR model building
X-PLOR refinement
XENGEN data reduction
X-PLOR phasing