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X-RAY DIFFRACTION
Materials and Methods page
1FUN
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details pH 7.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 205.2 α = 90
    b = 167 β = 90
    c = 145.5 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 287
     
    Diffraction Detector
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength 1.08
    Site SSRL
    Beamline BL7-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.85
    Resolution(Low) 99
    Number Reflections(Observed) 58307
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.105
    Redundancy 5.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.85
    Resolution(Low) 8.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 55654
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.189
    R-Work 0.189
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.017
    x_angle_deg 1.7
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11090
    Nucleic Acid Atoms 0
    Heterogen Atoms 25
    Solvent Atoms 239
     
     
  •   Software and Computing Hide
    Computing
    Structure Solution X-PLOR
    Structure Refinement X-PLOR
     
    Software
    refinement X-PLOR
    model building X-PLOR