X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.3 α = 90
b = 82.7 β = 97.9
c = 58.7 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE -- -- 1993
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE BEAMLINE DW32 0.9, 1.0 LURE DW32

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 12 92.0 0.05 -- -- 6.0 -- 45121 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.7 8.0 -- 0.0 -- 45000 -- -- -- 0.184 0.184 0.22 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 19.2
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.012
x_angle_deg 1.37
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.1
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3499
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 487

Software

Computing
Computing Package Purpose
MOSFLM Data Reduction (intensity integration)
X-PLOR 3.0 Structure Solution
X-PLOR 3.0 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.0 refinement
X-PLOR version: 3.0 model building
MOSFLM data collection