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X-RAY DIFFRACTION
Materials and Methods page
1FM9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 22.0
    Details 17% PEG 4K, 200mM NaSCN, 8% Ethylene Glycol , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 22K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.14 α = 90
    b = 54.05 β = 90
    c = 211.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Collection Date 1999-12-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 17-ID
    Wavelength 1
    Site APS
    Beamline 17-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.1
    Resolution(Low) 20
    Number Reflections(Observed) 25483
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.094
    B(Isotropic) From Wilson Plot 25.3
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.1
    Resolution(Low) 20.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 29087
    Number of Reflections(R-Free) 2895
    Percent Reflections(Observed) 91.8
    R-Factor(Observed) 0.239
    R-Work 0.239
    R-Free 0.268
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 49.0
    Anisotropic B[1][1] -3.73
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.42
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.69
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.23
    Number of Reflections(R-Free) 444
    Number of Reflections(R-Work) 3820
    R-Factor(R-Work) 0.308
    R-Factor(R-Free) 0.334
    R-Free Error 0.016
    Percent Reflections(Observed) 82.5
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.22
    c_scbond_it 1.41
    c_mcangle_it 2.14
    c_mcbond_it 1.2
    c_improper_angle_d 0.96
    c_dihedral_angle_d 20.4
    c_angle_deg 1.6
    c_bond_d 0.013
     
    Coordinate Error
    Luzzati ESD(Observed) 0.28
    Luzzati Sigma A(Observed) 0.27
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.33
    Luzzati Sigma A(R-Free Set) 0.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4148
    Nucleic Acid Atoms 0
    Heterogen Atoms 63
    Solvent Atoms 131
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MAR
    Data Reduction (data scaling) HKL-2000
    Structure Solution X-PLOR
    Structure Refinement CNS 0.5
     
    Software
    refinement CNS version: 0.5
    model building X-PLOR