X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 18.0
Details PEG MME 5000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 18K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 74.06 α = 90
b = 74.06 β = 90
c = 277.75 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH -- 1999-12-13
IMAGE PLATE MARRESEARCH -- 2000-01-24
Diffraction Radiation
Monochromator Protocol
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MPG/DESY, HAMBURG BEAMLINE BW6 0.9790, 0.9795, 0.9200 MPG/DESY, HAMBURG BW6
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7A -- EMBL/DESY, Hamburg BW7A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 91.2 0.094 -- -- 7.0 237598 33503 0.0 0.0 19.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 2.0 97.1 0.242 -- -- 4.6 3020

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.9 6.0 0.0 0.0 33502 33502 3354 94.7 0.199 0.199 0.199 0.225 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 2.01 -- 578 5000 0.223 0.252 0.01 97.1
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 31.8
Anisotropic B[1][1] 2.65
Anisotropic B[1][2] 2.38
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.65
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.3
RMS Deviations
Key Refinement Restraint Deviation
c_angle_deg 1.1
c_improper_angle_d 0.73
c_mcangle_it 4.28
c_scbond_it 3.282
c_scangle_it 6.864
c_bond_d 0.005
c_dihedral_angle_d 18.7
c_mcbond_it 2.096
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.21
Luzzati Sigma A (Observed) 0.12
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.24
Luzzati Sigma A (R-Free Set) 0.14
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2759
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 166

Software

Software
Software Name Purpose
CNS refinement
MAR data reduction
SCALEPACK data scaling
CNS phasing