X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7
Details TWO SLIGHTLY DIFFERENT CRYSTAL FORMS OF FAB 5G9 WERE OBTAINED USING 17.5% PEG 10K AT PH 8.5 AND 1.35M SODIUM CITRATE AT PH 5.5 AS PRECIPITANTS. THE TWO CRYSTAL FORMS ARE BOTH ORTHORHOMBIC, P212121, WITH TYPICAL SIZES OF 0.5 X 0.4 X 0.3 MM3 (CITRATE FORM) AND 0.6 X 0.35 X 0.2 MM3 (PEG FORM), WITH SLIGHTLY DIFFERENT CELL PARAMETERS OF A=89.1A, B=90.5A, C=59.3A (CITRATE) AND A=91.6A, B=93.7A, C=60.7A (PEG). PEG FORM IS USED FOR STRUCTURE DETERMINATION., pH 7.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 91.6 α = 90
b = 93.7 β = 90
c = 60.7 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 297
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS COLLIMATOR 1992-03
Diffraction Radiation
Monochromator Protocol
NI FILTER --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ELLIOTT GX-18 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.38 37 90.0 -- 0.075 -- 4.5 -- 19394 -- 0.0 30.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.39 2.54 58.5 -- 0.183 4.0 1.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 8.0 -- 0.0 -- 16666 1643 92.4 -- 0.217 0.217 0.304 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.61 -- 169 1541 0.304 0.406 0.02 73.7
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
Mean Isotropic B 10.2
RMS Deviations
Key Refinement Restraint Deviation
x_dihedral_angle_d 28.5
x_bond_d 0.015
x_improper_angle_d 1.67
x_scbond_it 6.83
x_angle_deg 2.0
x_scangle_it 10.32
x_mcangle_it 6.91
x_mcbond_it 4.28
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.27
Luzzati Sigma A (Observed) 0.28
Luzzati Resolution Cutoff (Low) 5.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3304
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
XENGEN Data Reduction (data scaling)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 model building
XENGEN data collection
XENGEN data reduction
X-PLOR version: 3.1 refinement