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X-RAY DIFFRACTION
Materials and Methods page
1F0W
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 30.47 α = 90
    b = 59.39 β = 90
    c = 68.78 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 293
     
    Diffraction Detector
    Detector IMAGE PLATE
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Source ROTATING ANODE
    Source ROTATING ANODE
    Source ROTATING ANODE
    Type RIGAKU RU200
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 27.4
    Number Reflections(Observed) 10122
    Percent Possible(Observed) 97.2
    R Merge I(Observed) 0.064
    B(Isotropic) From Wilson Plot 17.2
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 94.7
    R Merge I(Observed) 0.475
    Mean I Over Sigma(Observed) 1.6
    Redundancy 4.3
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.9
    Resolution(Low) 10.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 6756
    Number of Reflections(R-Free) 675
    Percent Reflections(Observed) 65.9
    R-Factor(Observed) 0.188
    R-Work 0.188
    R-Free 0.279
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 24.6
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 2.02
    Number of Reflections(R-Free) 33
    Number of Reflections(R-Work) 574
    R-Factor(R-Work) 0.363
    R-Factor(R-Free) 0.489
    R-Free Error 0.085
    Percent Reflections(Observed) 36.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_scangle_it 4.07
    x_scbond_it 2.68
    x_mcangle_it 2.56
    x_mcbond_it 1.6
    x_improper_angle_d 1.72
    x_dihedral_angle_d 25.5
    x_angle_deg 1.9
    x_bond_d 0.014
     
    Coordinate Error
    Luzzati ESD(Observed) 0.23
    Luzzati Sigma A(Observed) 0.21
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.3
    Luzzati Sigma A(R-Free Set) 0.26
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1001
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 137
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Structure Solution X-PLOR
    Structure Refinement X-PLOR 3.851
     
    Software
    refinement X-PLOR version: 3.851
    model building X-PLOR
    data collection XDS