X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.5 α = 90
b = 71.5 β = 90
c = 122.86 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS -- 1995-11-15
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 17 87.7 0.0723 -- -- 4.5 -- 16869 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.1 17.0 -- 0.0 -- 16869 -- 87.7 -- 0.172 0.172 0.204 --
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.09
x_bond_d 0.006
x_angle_deg 1.498
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1896
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 107

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building
XENGEN data collection