X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 125.5 α = 90
b = 125.5 β = 90
c = 107.3 γ = 90
Symmetry
Space Group I 4 2 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS -- 1992-06-03
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 85.3 0.13 -- -- 2.7 -- 24924 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.1 20.0 -- 1.0 24924 20034 -- 85.3 -- -- 0.171 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 19.3
RMS Deviations
Key Refinement Restraint Deviation
t_nbd 0.048
t_it 1.7
t_gen_planes 0.017
t_trig_c_planes 0.009
t_dihedral_angle_d 24.0
t_angle_deg 2.2
t_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2698
Nucleic Acid Atoms 0
Heterogen Atoms 13
Solvent Atoms 110

Software

Computing
Computing Package Purpose
XDS, XSCALE Data Reduction (intensity integration)
X-PLOR Structure Solution
TNT, X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
TNT refinement
X-PLOR model building