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X-RAY DIFFRACTION
Materials and Methods page
1DT6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 24.0
    Details 2.5 M ammonium sulphate, 0.1 M sodium cacodylate, 2.4mM CYMAL-5, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 24K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 74.7 α = 90
    b = 132 β = 90
    c = 172.4 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
    Diffrn ID 3
    Data Collection Temperature 100
    Diffrn ID 4
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 1998-05-02
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 1998-03-06
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 1998-04-01
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 1998-04-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-1
    Wavelength 0.97
    Site SSRL
    Beamline BL9-1
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength 1.08
    Site SSRL
    Beamline BL7-1
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM14
    Wavelength 0.849
    Site ESRF
    Beamline BM14
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM14
    Wavelength 1.739
    Site ESRF
    Beamline BM14
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3
    Resolution(Low) 25
    Number Reflections(All) 16332
    Number Reflections(Observed) 63981
    Percent Possible(Observed) 97.1
    R Merge I(Observed) 0.058
    B(Isotropic) From Wilson Plot 65.0
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.1
    Percent Possible(All) 75.6
    R Merge I(Observed) 0.318
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 3.0
    Resolution(Low) 25.0
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 16288
    Number of Reflections(Observed) 16288
    Number of Reflections(R-Free) 809
    Percent Reflections(Observed) 93.2
    R-Factor(All) 0.241
    R-Factor(Observed) 0.241
    R-Work 0.238
    R-Free 0.313
    R-Free Selection Details random 5%
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_angle_deg 1.77
    c_angle_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3589
    Nucleic Acid Atoms 0
    Heterogen Atoms 59
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) CCP4 (SCALA)
    Structure Solution XTALVIEW
    Structure Refinement CNS
     
    Software
    refinement CNS
    model building XTALVIEW
    data reduction SCALA
    data collection DENZO