X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.99 α = 101.26
b = 65.02 β = 109.89
c = 40.36 γ = 74.32
Symmetry
Space Group P 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR XENTRONICS -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- -- 0.06 -- -- 4.0 -- n/a -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.0 7.5 -- 1.5 -- 23681 -- -- -- 0.188 0.188 0.203 --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.016
x_mcangle_it 2.03
x_scangle_it 2.8
x_mcbond_it 1.48
x_scbond_it 2.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3424
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 76

Software

Software
Software Name Purpose
XENGEN data collection
X-PLOR model building
X-PLOR refinement
XENGEN data reduction
X-PLOR phasing