X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 8.5
Temperature 292.0
Details CRYSTALS WERE GROWN IN 2.5M AMMONIUM SULFATE SOLUTION, BUFFERED WITH 20MM TRIS/ HCL TO PH 8.5. THE CRYSTALLIZATION SOLUTION WAS REPLACED IN STEPS AGAINST A SOLUTION CONTAINING 2.5M AMMONIUM SULFATE, 20MM TRIS, 300MG/ML TREHALOSE AT PH 8.5., temperature 292K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 90.46 α = 90
b = 90.46 β = 90
c = 45.26 γ = 120
Symmetry
Space Group P 6

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 105
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS HI-STAR graphite 1998-11-03
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS FR591 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 10 94.5 0.043 -- -- 5.5 -- 32053 -- 2.0 9.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.55 82.3 0.139 -- 5.1 3.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.5 7.0 -- 0.0 31820 31820 3190 94.5 0.192 0.192 0.189 0.215 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.57 -- 337 3093 0.236 0.257 -- 81.9
RMS Deviations
Key Refinement Restraint Deviation
x_dihedral_angle_d 17.9
x_bond_d 0.007
x_angle_deg 1.1
x_improper_angle_d 1.27
Coordinate Error
Parameter Value
Luzzati Sigma A (Observed) 0.14
Luzzati Resolution Cutoff (Low) 7.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1223
Nucleic Acid Atoms 0
Heterogen Atoms 78
Solvent Atoms 191

Software

Software
Software Name Purpose
X-PLOR refinement version: 3.1
SAINT data reduction version: (SIEMENS)
SAINT data scaling version: (SIEMENS)
CCP4 data scaling version: (AGROVATA
TRUNCATE) data scaling