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X-RAY DIFFRACTION
Materials and Methods page
1DLO
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 235.5 α = 90
    b = 70.3 β = 106.1
    c = 93.3 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE AREA DETECTOR
    Collection Date 1994-10
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength 0.908
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Number Reflections(Observed) 41049
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.055
    Redundancy 3.5
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.7
    Resolution(Low) 8.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 38310
    R-Factor(Observed) 0.249
    R-Work 0.249
    R-Free 0.336
     
    Temperature Factor Modeling
    Mean Isotropic B Value 44.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.015
    x_angle_deg 2.0
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7691
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1