X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 93.18 α = 90
b = 93.18 β = 90
c = 73.89 γ = 120
Symmetry
Space Group P 61

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
DIFFRACTOMETER RIGAKU AFC-6R -- 1994-01-11
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 30 100.0 0.11 -- -- 1.0 -- 15448 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.45 10.0 -- 2.0 -- 6948 -- 33.0 -- 0.156 0.156 0.171 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 11.0
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.77
x_bond_d 0.013
x_angle_deg 2.067
x_dihedral_angle_d 26.15
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2503
Nucleic Acid Atoms 0
Heterogen Atoms 89
Solvent Atoms 179

Software

Computing
Computing Package Purpose
TEXSAN Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building